ma-N 1400 - Negative Tone Photoresist Series
for Conventional Pattern Transfer and Single-Layer Lift-Off Processes
Unique Features
- Resists available in a variety of viscosities
- Aqueous alkaline development
- Tunable pattern profile: vertical to undercut
- High wet and dry etch resistance
- Good thermal stability of the resist pattern
- Easy to remove
Applications
- Microelectronics and micro systems technology
- Mask for lift-off processes
- Etch mask for semiconductors and metals
- Well suitable for implantation
- Mould for electroplating
Resist | Film Thickness [µm] spin coating @ 3000 rpm |
Spectral Sensitivity | Special Feature |
ma-N 1405 | 0.5 | 300 - 410nm
i-line - 365 nm (h-line - 405 nm) |
Novolak based resist, thermal stability up to 160°C for metal evaporation and sputtering |
ma-N 1407 | 0.7 | ||
ma-N 1410 | 1.0 | ||
ma-N 1420 | 2.0 | ||
ma-N 1440 | 4.0 | ||
ma-N 402 | 0.2 | 300 - 380nm
i-line - 365 nm |
Novolak based resist, thermal stability up to 110°C for metal evaporation |
ma-N 405 | 0.5 | ||
ma-N 415 | 1.5 | ||
ma-N 420 | 2.0 | ||
ma-N 440 | 4.1 | ||
ma-N 490 | 7.5 |
Recommended process chemicals:
for ma-N 1400 Series
Thinner: ma-T 1046
Developer: ma-D 533/S (TMAH based)
Remover: mr-Rem 700 (NMP & NEP free), mr-Rem 500 (NMP free), ma-R 404/S (strongly alkaline)
Lift-off: mr-Rem 700 (NMP & NEP free), mr-Rem 500 (NMP free)
for ma-N 400 Series
Thinner: ma-T 1049
Developer: ma-D 331/S, ma-D 332/S (NaOH based), 531/S, ma-D 532/S (TMAH based)
Remover: mr-Rem 700 (NMP & NEP free), mr-Rem 500 (NMP free), ma-R 404/S (strongly alkaline)
Lift-off: mr-Rem 700 (NMP & NEP free), mr-Rem 500 (NMP free)